In: Systems Analysis, Modelling, Simulation; Vol. 7, No. 11--12,, pages 865-872. 1990.
Abstract: The paper presents a method of modelling LSI/VLSI circuits at the functional level, and test generation methodology using this model. As the modelling tool Petri nets have been used. A VLSI circuit is modelled as a network of interconnected functional modules such as registers, counters, multiplexers, adders and others. Each of these modules is modelled by means of Petri nets. Such a model of a VLSI circuit and a functional fault model are quite independent of the circuit implementation details. By using Petri net models one can generate tests for the primitive functional modules and for the whole unit.
Keywords: logical LSI/VLSI system; interconnected functional modules; multiplexer; functional approach.