For the most recent entries see the
Petri Nets Newsletter.
Test Generation for Sequential Logic Circuits Using Petri Nets.
Tabakow, I.G.
In:
Newsletter No. 15, pages 5-10.
Bonn, Germany: Gesellschaft für Informatik (GI), Special Interest Group on Petri Nets and Related System Models,
October 1983.
Keywords:
logic circuits, (test generation for).
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